Electron microscopy with energy dispersive X-ray spectrometry (EDX/EDS) is the example of non-destructive analytical method for surface elemental analysis, with a potential detection limit of 0.1-0.5 wt.% for most elements. A spatial resolution <10 nm can be achieved using this technique, which provides a basis for the generation of quantitative and qualitative elemental data for individual particles. In order to obtain quantitative concentration data from EDX/EDS analyses it is necessary to apply sample composition-dependent matrix corrections to the initial X-ray spectrum data. The corrections are based on algorithms built into the instrument data processing software, and attempt to take into account the loss of resolution caused by beam diffraction, absorption and X-ray fluorescence within the particle matrix.In years 2006-2010 particulate matter analysis was carried out for dust samples collected from Gdansk and London area. Research was performed with the usage of two different electron microscopes: Scanning Electron Microscope with EDX (Jeol 840 PGT Avalon EDX) and Transition Electron Microscope with EDS (Jeol JEM 2000FX). The investigation of elementary composition with the usage of EDS/EDX detector, showed that in the most of samples mineral particulate matter containing mainly Si, Al, K, Ca appeared (both in Gdansk and London). In tested samples particles with metals as Mg, Fe, Zn, Cu, Ti were also present (mostly in London).
Authors
Additional information
- Category
- Aktywność konferencyjna
- Type
- publikacja w wydawnictwie zbiorowym recenzowanym (także w materiałach konferencyjnych)
- Language
- angielski
- Publication year
- 2010
