This chapter presents an introduction to the area of accelerated transistor-level (‘fast-SPICE’) simulation for automated verification and characterization of integrated circuits (ICs) from technologist’s perspective. It starts with outlining goals, expectations and typical usage models for fast-SPICE simulators, stressing how they differ from regular SPICE tools. It continues with presenting and classifying core technologies typically included in fast-SPICE simulators, which allow them to achieve critical performance and capacity gains. Also, it discusses how different approaches toward the computational problem can be combined to design and implement highly effective and efficient simulation acceleration technologies, including advanced circuit partitioning, and schemes for optimized modeling of post-layout memory circuits and large parasitic networks. Finally, challenges facing fast-SPICE, as well as possible future research areas are briefly outlined.
Authors
Additional information
- DOI
- Digital Object Identifier link open in new tab 10.1007/978-94-007-0149-6_2
- Category
- Aktywność konferencyjna
- Type
- publikacja w wydawnictwie zbiorowym recenzowanym (także w materiałach konferencyjnych)
- Language
- angielski
- Publication year
- 2009
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