Embedded system and software testing requires sophisticated methods, which are nowadays frequently supported by application of test patterns. This eases the test development process and contributes to the reusability and maintainability of the test specification. However, it does not guarantee the proper level of quality and test coverage in d ifferent dimensions of the test specification. In this paper the quality of the test is investigated and numerous metrics are defined. They are based mainly on the applied test patterns. They give a measure of quality for the test design and executed test cases w.r.t. a number of aspects. They also evidence the value of patterns application. If weighted, they enable to assess the executed tests.
Authors
Additional information
- DOI
- Digital Object Identifier link open in new tab 10.1145/1753196.1753200
- Category
- Aktywność konferencyjna
- Type
- publikacja w wydawnictwie zbiorowym recenzowanym (także w materiałach konferencyjnych)
- Language
- angielski
- Publication year
- 2008
