Publications Repository - Gdańsk University of Technology

Test suites for embedded systems are typically created from scratch using dif- ferent, often inadequate methods. In consequence, industry branches dealing with software-intensive embedded systems have to cope with quality problems, even though test processes are particularly time-consuming and costly. Based on an evolving model-based testing methodology we introduce test design patterns for simplifying and accelerating the test specification process. Making use of patterns, complex test objectives are covered with lower effort and test cases contain fewer design errors.

Authors

• dr inż. Justyna Zander link open in new tab ,
• Abel Marrero Perez,
• Ina Schieferdecker,
• Zhen Ru Dai