Publications Repository - Gdańsk University of Technology

This work presents the result of structure investigations ofV 2O5 nanorods grown from thin films and powders prepared by sol-gel method. To examine the best temperature of nanorods crystallization, thin films deposited by spin-coating method on quartz glass or silicon substrates and bulk xerogel powders were annealed at various temperatures ranging from 100∘C to 600∘C. The structure of the samples was characterized by X-ray diffraction method (XRD), scanning electron microscope (SEM), differential scanning calorimetry (DSC), thermogravimetric analysis (TGA), and mass spectroscopy (MS). The rod-like structure of V2O5 was obtained at 600∘C on both quartz glass and silicon substrates and also from the bulk xerogel. The growth process and the effect of annealing treatment on the nanostructure are briefly discussed.

Authors

• dr inż. Marta Prześniak-Welenc link open in new tab ,
• dr inż. Marcin Stanisław Łapiński link open in new tab ,
• Tomasz Lewandowski link open in new tab ,
• prof. dr hab. inż. Barbara Kościelska link open in new tab ,
• dr inż. Leszek Wicikowski link open in new tab ,
• prof. dr hab. inż. Wojciech Sadowski link open in new tab