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Gdańsk University of Technology

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A method of self-testing of an analog circuit terminated by an ADC in electronic embedded systems controlled by microcontrollers

A new self-testing method of analog parts terminated by an ADC in electronic embedded systems controlled by microcontrollers is presented. It is based on a new fault diagnosis method based on on-line (i.e. during measurement), transformations of voltage samples of the time response of a tested part to a square pulse - onto localization curves placed in the measurement space. The method can be used for fault detection and single soft fault localization.

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Additional information

DOI
Digital Object Identifier link open in new tab 10.15199/48.2016.11.05
Category
Publikacja w czasopiśmie
Type
artykuły w czasopismach recenzowanych i innych wydawnictwach ciągłych
Language
angielski
Publication year
2016

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