In this paper, a technique for low-cost statistical analysis and yield estimation of compact microwave couplers has been presented. The analysis is executed at the level of a fast surrogate model representing selected characteristic points of the coupler response that are critical to determine satisfaction/violation of the prescribed design specifications. Because of less nonlinear dependence of the characteristic points on geometry parameters of the structure at hand (compared to the original response, i.e., S-parameters versus frequency), only a small number of training points is necessary to setup the surrogate. Our approach is demonstrated using a compact rat-race microstrip coupler at a design corresponding to the operating frequency of 1 GHz. Numerical verification involving direct Monte Carlo analysis of the EM simulation model of the coupler confirms reliability of the proposed technique.
Authors
Additional information
- DOI
- Digital Object Identifier link open in new tab 10.1109/mikon.2016.7491961
- Category
- Aktywność konferencyjna
- Type
- materiały konferencyjne indeksowane w Web of Science
- Language
- angielski
- Publication year
- 2016
