A new method of measuring RLC components for microcontroller systems dedicated to compact smart impedance sensors based on a direct sensor-microcontroller interface is presented. In the method this direct interface composed of a reference resistor connected in series with the tested sensor impedance is stimulated by a square wave generated by the microcontroller, and then its voltage response is sampled by an internal ADC of the microcontroller. The obtained set of voltage samples is used to determine values of the sensor model impedance components.
Authors
Additional information
- DOI
- Digital Object Identifier link open in new tab 10.15199/48.2017.10.08
- Category
- Publikacja w czasopiśmie
- Type
- artykuły w czasopismach recenzowanych i innych wydawnictwach ciągłych
- Language
- angielski
- Publication year
- 2017
