—A rapid statistical analysis and yield estimation of compact microwave couplers involving multiple performance parameters has been presented. The analysis is realized using a fast surrogate model representing appropriate characteristic points of the coupler response. Because of less nonlinear dependence of the characteristic points on the structure geometry (compared to the original response, i.e., S-parameters vs. frequency), a small number of training points is necessary to setup a reliable surrogate. Our approach is demonstrated using a compact rat-race coupler and validated using direct EM-based Monte Carlo analysis. Accelerated yield optimization is also presented
Authors
Additional information
- DOI
- Digital Object Identifier link open in new tab 10.23919/ropaces.2017.7916033
- Category
- Aktywność konferencyjna
- Type
- materiały konferencyjne indeksowane w Web of Science
- Language
- angielski
- Publication year
- 2017
