A dual-wavelength method in high accuracy polarimetry has been successfully tested and applied to measure optical activity (OA) of nonlinear crystals. In proposed polarimetric scheme two neighboring semiconductor laser wavelengths (635 and 650 nm) are used, which increases number of parameters measured simultaneously and improves the data processing. By neglecting dispersion of eigen wave ellipticity in crystals, more efficient elimination of the systematic errors, in comparison with the known HAUP technique, is possible. We have tested our experimental setup on optically inactive lithium niobate crystal and obtained OA in the perpendicular to the optical axis direction for quartz and DKDP crystals.
Authors
- dr Mykola Shopa link open in new tab ,
- dr Nazar Ftomyn
Additional information
- DOI
- Digital Object Identifier link open in new tab 10.1117/1.oe.57.3.034101
- Category
- Publikacja w czasopiśmie
- Type
- artykuł w czasopiśmie wyróżnionym w JCR
- Language
- angielski
- Publication year
- 2018