In this work the structural properties and photoluminescence of tellurium dioxide thin films doped by europium were described. Thin films were deposited by magnetron sputtering method and simultaneously heated at 200 °C. Presence of Eu ions and their valence states was confirmed by X-ray photoemission spectroscopy measurements. The structure of the films as well as the influence of europium dopant on crystalline structure of the films was examined by X-ray diffraction method. Morphology of the samples was observed by atomic force microscope. Doping by europium didn't change structural parameters. Optical measurements showed photoluminescence from Eu2+ and Eu3+ ions. However, in the spectrum there is no line corresponding to 5D0 → 7F2 transition due to an electric-dipole transition, usually present in amorphous surrounding.
Authors
- dr hab. inż. Marcin Łapiński link open in new tab ,
- Michalina Walas link open in new tab ,
- Anna Gapska link open in new tab ,
- Dorota Kulik link open in new tab ,
- Aneta Szmytke link open in new tab ,
- Piotr Twardowski link open in new tab ,
- prof. dr hab. inż. Wojciech Sadowski link open in new tab ,
- prof. dr hab. inż. Barbara Kościelska link open in new tab
Additional information
- DOI
- Digital Object Identifier link open in new tab 10.1016/j.tsf.2019.137592
- Category
- Publikacja w czasopiśmie
- Type
- artykuły w czasopismach
- Language
- angielski
- Publication year
- 2019
