In this paper, a novel fabrication technology of atomic force microscopy (AFM) probes integrating cantilever tips with an NV-rich diamond particle is presented. Nanomanipulation techniques combined with the focused electron beam-induced deposition (FEBID) procedure were applied to position the NV-rich diamond particle on an AFM cantilever tip. Ultrasonic treatment of nanodiamond suspension was applied to reduce the size of diamond particles for proper geometry and symmetry. The fabricated AFM probes were tested utilizing measurements of the electrical resistance at highly oriented pyrolytic graphite (HOPG) and compared with a standard AFM cantilever performance. The results showed novel perspectives arising from combining the functionalities of a scanning AFM with optically detected magnetic resonance (ODMR). In particular, it offers enhanced magnetometric sensitivity and the nanometric resolution.
Authors
- dr inż. Mateusz Ficek link open in new tab ,
- Maciej Głowacki link open in new tab ,
- Krzysztof Gajewski,
- Piotr Kunicki,
- Ewelina Gacka,
- dr Krystian Sycz,
- dr Mariusz Mrózek,
- dr Adam M. Wojciechowski,
- Teodor Gotszalk,
- prof. dr hab. Wojciech Gawlik,
- dr hab. inż. Robert Bogdanowicz link open in new tab
Additional information
- DOI
- Digital Object Identifier link open in new tab 10.3390/coatings11111332
- Category
- Publikacja w czasopiśmie
- Type
- artykuły w czasopismach
- Language
- angielski
- Publication year
- 2021
