This paper concerns the implementation of shape-designed complementary signals (CSs), matched to the frequency characteristic of the circuit under test, in built-in self testers (BISTs), dedicated to mixed-signal embedded electronic systems for testing their analog sections. The essence of the proposed method and solution of CS BIST is low-cost realization on the base of hardware and software resources of microcontrollers used in contemporary embedded systems. The paper presents a description and a theoretical basis of known bipolar CSs and unipolar CSs proposed by the authors, results of investigations of metrological properties of CSs, solution of CS BIST and its experimental verification on the examples of testing 2nd and 4th order Butterworth filters.
Autorzy
Informacje dodatkowe
- DOI
- Cyfrowy identyfikator dokumentu elektronicznego link otwiera się w nowej karcie 10.1109/tim.2009.2023819
- Kategoria
- Publikacja w czasopiśmie
- Typ
- artykuł w czasopiśmie wyróżnionym w JCR
- Język
- angielski
- Rok wydania
- 2010
