Noise is generated in all semiconductor devices. The intensity of these fluctuations depends on used elements, manufacturing process, operating conditions and device type. The result noise is a superposition of different kinds of fluctuations like thermal noise, generation-recombination noise, 1/f noise, shot noise and Random Telegraph Signal (RTS) noise. The last one, RTS noise is observed as nonstationary impulse fluctuations. Unfortunately, it is hard to notice and investigate the RTS because of DC component value in contradiction to small amplitude of noise impulses. In the paper a simple filtrating system which removes the DC component without AC signal distortion is presented. Example oscilloscope measurement results and their analysis are also shown.
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Informacje dodatkowe
- Kategoria
- Publikacja w czasopiśmie
- Typ
- artykuły w czasopismach recenzowanych i innych wydawnictwach ciągłych
- Język
- angielski
- Rok wydania
- 2012
