The new solution of a BIST called the JTAG BIST for self-testing of analog parts of electronic embedded systems is presented in the paper. The JTAG BIST consists of the BCT8244A and SCANSTA476 integrated circuits of Texas Instruments controlled via the IEEE 1149.1 bus. The BCT8244A is a scan test device with octal buffers, and the SCANSTA476 is a 12-bit ADC with 8 analog input channels. Self-testing approach is based on the fault diagnosis method in which we stimulate the tested analog part by the single square pulse using the BCT8244A and we sample the time response of the analog part two times by the SCANSTA476. The measurement results are used for fault detection and also a single soft fault localization of the analog part.
Autorzy
Informacje dodatkowe
- Kategoria
- Aktywność konferencyjna
- Typ
- publikacja w wydawnictwie zbiorowym recenzowanym (także w materiałach konferencyjnych)
- Język
- angielski
- Rok wydania
- 2013
