Repozytorium publikacji - Politechnika Gdańska

We present methods and problems of noise measurements in electrical double-layer capacitors (EDLC). Detailed noise equivalent electronic circuit is considered, and two possible ways of observations of random processes generated in the EDLCs structures are studied. We conclude that noise is a useful tool for characterization of the EDLC structures and their state-of-health, as in other materials and electronic devices. Eventual, practical applications of noise measurements are proposed to determine the state-of-health of the EDLCs.

Autorzy

• prof. dr hab. inż. Janusz Smulko link otwiera się w nowej karcie ,
• dr inż. Arkadiusz Szewczyk link otwiera się w nowej karcie ,
• Łukasz Lentka link otwiera się w nowej karcie