Repozytorium publikacji - Politechnika Gdańska

Based on previous reports on the optical microscopy contrast of mechanically exfoliated few layer CrCl3 transferred on 285 nmand 270 nmSiO2 on Si(100), we focus on the experimental determination of an effective mean complex refractive index via a fitting analysis based on the Fresnel equations formalism. Accordingly, the layer and wavelength-dependent absorbance and reflectance are calculated. Layer and wavelength-dependent optical contrast curves are then evaluated demonstrating that the contrast is significantly high only around welldefined wavelength bands. This is validated a posteriori, by experimental UVVis absorbance data. The present study aims to show the way towards the most reliable determination of thickness of the 2D material flakes during exfoliation.

Autorzy

• Shafaq Kazim,
• Roberto Gunnella,
• Marco Zannotti,
• Rita Giovannetti,
• prof. dr hab. inż. Tomasz Klimczuk link otwiera się w nowej karcie ,
• Luca Ottaviano