In the paper authors present two methods, which allows to identify the RTS noise in noise signal of semiconductor devices. The first one was elaborated to identify the RTS noise and also to estimate the number of its levels. The second one can be used to estimate all of the parameters of Gaussian and non-Gaussian components in the noise signal in a frequency domain.
Authors
Additional information
- DOI
- Digital Object Identifier link open in new tab 10.1063/1.3140473
- Category
- Aktywność konferencyjna
- Type
- publikacja w wydawnictwie zbiorowym recenzowanym (także w materiałach konferencyjnych)
- Language
- angielski
- Publication year
- 2009
Source: MOSTWiedzy.pl - publication "The Methods for RTS Noise Identification" link open in new tab
