Operation of a polarization interferometer for measurement of the wavelength changes of a tunable semiconductor laser was investigated. A lambda/8 waveplate made from liquid crystalline polymer is placed in one of interferometers’ arms in order to generate two output signals in quadrature. Wavelength was measured with resolution of 2 pm in the wavelength range 628–635 nm. Drift of the interferometer, measured in the period of 500 s, was 8 nm, which corresponded to the change in the wavelength of 1.3 pm. If needed, wavelength-dependent Heydemann correction can be used to expand the range of operation of such interferometer
Authors
Additional information
- DOI
- Digital Object Identifier link open in new tab 10.3390/s16050633
- Category
- Publikacja w czasopiśmie
- Type
- artykuł w czasopiśmie wyróżnionym w JCR
- Language
- angielski
- Publication year
- 2016
