Operation of a polarization interferometer for measurement of the wavelength changes of a tunable semiconductor laser was investigated. A lambda/8 waveplate made from liquid crystalline polymer is placed in one of interferometers’ arms in order to generate two output signals in quadrature. Wavelength was measured with resolution of 2 pm in the wavelength range 628–635 nm. Drift of the interferometer, measured in the period of 500 s, was 8 nm, which corresponded to the change in the wavelength of 1.3 pm. If needed, wavelength-dependent Heydemann correction can be used to expand the range of operation of such interferometer
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Informacje dodatkowe
- DOI
- Cyfrowy identyfikator dokumentu elektronicznego link otwiera się w nowej karcie 10.3390/s16050633
- Kategoria
- Publikacja w czasopiśmie
- Typ
- artykuł w czasopiśmie wyróżnionym w JCR
- Język
- angielski
- Rok wydania
- 2016