We present results of the probability distribution analysis of flicker noise generated in Au nanoparticle (AuNP) decorated graphene–Si Schottky barrier diodes with and without yellow light illumination (592 nm), close to the localized surface plasmon resonance in the AuNPs (586 nm). The AuNPs occupy imperfections in the single-layer graphene and reduce the flicker noise intensity generated in the graphene layer. The estimated probability distribution exhibited an asymmetry shift when the sample was irradiated by yellow light (a 10-fold increase of the skewness coefficient). This effect is attributed to AuNPs collecting low-frequency fluctuations in the graphene layer and reducing 1/f noise.
Authors
- prof. dr hab. inż. Janusz Smulko link open in new tab ,
- dr inż. Andrzej Kwiatkowski link open in new tab ,
- mgr inż. Katarzyna Drozdowska link open in new tab ,
- Lars Österlund,
- Tesfalem Welearegay,
- Adil Rehman,
- Sergey Rumyantsev
Additional information
- DOI
- Digital Object Identifier link open in new tab 10.1109/icnf57520.2023.10472774
- Category
- Aktywność konferencyjna
- Type
- publikacja w wydawnictwie zbiorowym recenzowanym (także w materiałach konferencyjnych)
- Language
- angielski
- Publication year
- 2023
